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SIOS has very innovative solutions in their range of ultraprecise measurement instruments based on laser interferometry. Positions or movements can be resolved down to 0.1 nanometer, even for distances up to 5 meters. From such accurate position measurement, derived quantities like weight, force and pressure can be established with excellent resolution. 
SP-TR Triple-beam Interferometer |
The light source in the instruments is a stabilized helium neon laser, which has a patented two-mode stabilization technique providing high frequency stability in conjunction with rapid warm-up. This stabilized HeNe is also available as a standalone product.
The instruments are free of linearity error and each instrument has a sophisticated control unit with a unique and proprietary signal-processing unit and powerful software that readily gives resolutions of 1 nm for length measurements. In order to reach 0.1 nm resolution, air temperature, pressure and humidity are measured and compensated for by means of an optional environmental sensor unit. Available instruments include retro-reflector interferometers, plane-mirror interferometers, triple-beam interferometers for length, tip and tilt, vibrometers and gauging probes. |
MI Miniature Retroreflector Interferometer For more information about SIOS and their products, please see links under Partners or under Dialogue/Downloads. NOTE: New signal-processing and inteface board RE-10 available. |
